Course Descriptions

The Course Descriptions catalog describes all undergraduate and graduate courses offered by Michigan State University. The searches below only return course versions Fall 2000 and forward. Please refer to the Archived Course Descriptions for additional information.

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Definitions of Course Characteristics (pdf)

Course Descriptions: Search Results

MSM 451  X-Ray Crystallography

Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Effective Dates:
FS94 - US98


MSM 451  X-Ray Crystallography

Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Effective Dates:
FS98 - US02


MSE 451  X-Ray Crystallography

Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Effective Dates:
FS02 - SS04


MSE 451  Microscopic and Diffraction Analysis of Materials

Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Effective Dates:
US04 - US04


MSE 451  Microscopic and Diffraction Analysis of Materials

Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Effective Dates:
SS05 - SS05


MSE 451  Microscopic and Diffraction Analysis of Materials

Description:
General properties, generation, and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Effective Dates:
US05 - US05


MSE 451  Microscopic and Diffraction Analysis of Materials

Semester:
Fall of every year
Credits:
Total Credits: 3   Lecture/Recitation/Discussion Hours: 2   Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 350 and MSE 381
Restrictions:
Open only to juniors or seniors or graduate students in the Colleges of Engineering or Natural Science.
Description:
General properties, generation, and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester Alias:
MSM 451
Effective Dates:
FS05 - US11


MSE 451  Spectroscopic and Diffraction Analysis of Materials

Semester:
Fall of every year
Credits:
Total Credits: 3   Lecture/Recitation/Discussion Hours: 2   Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 350 and MSE 381
Restrictions:
Open to juniors or seniors or graduate students in the College of Engineering or in the College of Natural Science.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester Alias:
MSM 451
Effective Dates:
FS11 - US12


MSE 451  Spectroscopic and Diffraction Analysis of Materials

Semester:
Spring of every year
Credits:
Total Credits: 3   Lecture/Recitation/Discussion Hours: 2   Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 260 and MSE 381
Restrictions:
Open to juniors or seniors or graduate students in the College of Engineering or in the College of Natural Science.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester Alias:
MSM 451
Effective Dates:
FS12 - SS15


MSE 481  Spectroscopic and Diffraction Analysis of Materials

Semester:
Spring of every year
Credits:
Total Credits: 3   Lecture/Recitation/Discussion Hours: 2   Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 260 and MSE 381
Restrictions:
Open to juniors or seniors or graduate students in the College of Engineering or in the College of Natural Science.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester Alias:
MSE 451, MSM 451
Effective Dates:
US15 - US15


MSE 481  Spectroscopic and Diffraction Analysis of Materials

Semester:
Spring of every year
Credits:
Total Credits: 3   Lecture/Recitation/Discussion Hours: 2   Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B or PHY 294H or LB 274
Recommended Background:
MSE 260 and MSE 381
Restrictions:
Open to juniors or seniors in the Materials Science and Engineering Major or in the Materials Science and Engineering Minor.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester Alias:
MSE 451, MSM 451
Effective Dates:
FS15 - Open