Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis and techniques. Single crystal methods, stereographic projection. X-ray microanalysis.
Description:
General properties, generation and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Description:
General properties, generation, and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester:
Fall of every year
Credits:
Total Credits: 3 Lecture/Recitation/Discussion Hours: 2 Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 350 and MSE 381
Restrictions:
Open only to juniors or seniors or graduate students in the Colleges of Engineering or Natural Science.
Description:
General properties, generation, and detection of x-rays. Interaction with solids. Crystallography, reciprocal lattice, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester:
Fall of every year
Credits:
Total Credits: 3 Lecture/Recitation/Discussion Hours: 2 Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 350 and MSE 381
Restrictions:
Open to juniors or seniors or graduate students in the College of Engineering or in the College of Natural Science.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester:
Spring of every year
Credits:
Total Credits: 3 Lecture/Recitation/Discussion Hours: 2 Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 260 and MSE 381
Restrictions:
Open to juniors or seniors or graduate students in the College of Engineering or in the College of Natural Science.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester:
Spring of every year
Credits:
Total Credits: 3 Lecture/Recitation/Discussion Hours: 2 Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B
Recommended Background:
MSE 260 and MSE 381
Restrictions:
Open to juniors or seniors or graduate students in the College of Engineering or in the College of Natural Science.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Semester:
Spring of every year
Credits:
Total Credits: 3 Lecture/Recitation/Discussion Hours: 2 Lab Hours: 3
Prerequisite:
PHY 184 or PHY 184B or PHY 234B or PHY 294H or LB 274
Recommended Background:
MSE 260 and MSE 381
Restrictions:
Open to juniors or seniors in the Materials Science and Engineering Major or in the Materials Science and Engineering Minor.
Description:
General properties, generation, and detection of x-rays interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.