Course Descriptions

The Course Descriptions catalog describes all undergraduate and graduate courses offered by Michigan State University. The searches below only return course versions Fall 2000 and forward. Please refer to the Archived Course Descriptions for additional information.

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Course Descriptions: Search Results

MSE 841 Advanced Spectroscopy and Diffraction Analysis of Materials

Semester:
Fall of every year
Credits:
Total Credits: Credits: 3   Lecture/Recitation/Discussion Hours:2   Lab Hours: 3
Recommended Background:
PHY 184 or PHY 184B or PHY 234B
Restrictions:
Open to graduate students in the College of Engineering.
Not open to students with credit in:
MSE 451,
Description:
Physical basis for properties, generation, and detection of x-ray interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Effective Dates:
FS11 - FS12

MSE 841 Advanced Spectroscopy and Diffraction Analysis of Materials

Semester:
Spring of every year
Credits:
Total Credits: Credits: 3   Lecture/Recitation/Discussion Hours:2   Lab Hours: 3
Recommended Background:
PHY 184 or PHY 184B or PHY 234B
Restrictions:
Open to graduate students in the College of Engineering.
Not open to students with credit in:
MSE 451,
Description:
Physical basis for properties, generation, and detection of x-ray interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Effective Dates:
SS13 - SS15

MSE 881 Advanced Spectroscopy and Diffraction Analysis of Materials

Semester:
Spring of every year
Credits:
Total Credits: Credits: 3   Lecture/Recitation/Discussion Hours:2   Lab Hours: 3
Recommended Background:
PHY 184 or PHY 184B or PHY 234B
Restrictions:
Open to graduate students in the College of Engineering.
Not open to students with credit in:
MSE 481, MSE 841
Description:
Physical basis for properties, generation, and detection of x-ray interaction with solids. Crystallography, reciprocal space, diffraction analysis, and techniques. Single crystal methods. Stereographic projection. X-ray microanalysis.
Effective Dates:
US15 - Open