Stanley L. Flegler, Director
Microscopy, the science of microscope use, traces its origins to the work of Hooke and Leeuwenhoek in the late 1600’s. There are now many types of microscopes and dozens of different imaging and analytical methods. Images may be created using visible and invisible light, electrons, magnetic forces, mechanical probes, current flow, and atomic level attractive and repulsive forces. Much of the technology in our modern world would not have been possible without the images and analytical data from microscopes.
Microscopy is a vital resource in creating and applying knowledge to help address the critical problems of the 21st century.
The Center for Advanced Microscopy (CAM), a university Core Facility, is the Central microscopy laboratory for the Michigan State University campus. Teaching, research, and service work are provided in Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Confocal Laser Scanning Microscopy (CLSM), Laser Capture Microscopy (LCM), and Energy Dispersive X-ray Spectroscopy (EDS). CAM has a large user base from 49 departments in nine colleges. Outreach is provided on a local and national level. Our comprehensive teaching program includes NSC-810 Biological TEM Lab (FS, SS), NSC-815 Physical Science TEM Lab (FS, SS), NSC-816 Advanced Physical Science TEM lab (FS, SS), NSC-820 SEM Lab (FS, SS), and NSC-837 CLSM Lab (FS, SS).
In scanning electron microscopy we offer the following imaging/analytical capabilities: secondary and backscattered electron imaging, energy dispersive X-ray microanalysis, low vacuum, ultra-high resolution imaging, low voltage imaging of uncoated non-conducting samples. Specimen preparation methods include critical point and freeze drying, ultra-high resolution coating, cryo methods.
In transmission electron microscopy we offer the following imaging/analytical capabilities: bright/dark field imaging, Z contrast imaging, energy-filtered imaging, energy dispersive X-ray microanalysis, electron energy loss spectroscopy, cryo electron tomography, advanced diffraction methods. Specimen preparation methods include cryo and ambient temperature ultramicrotomy, advanced sample thinning equipment including ion beam milling.
In confocal laser scanning microscopy we offer the following imaging/analytical capabilities: super resolution, transmitted and reflectance imaging, fluorescence correlation spectroscopy, total internal reflectance fluorescence microscopy, fluorescence recovery after photo beaching, Forster resonance energy transfer, live and fixed cell imaging, differential interference contrast, polarization, phase contrast. Numerous laser lines are available.